where bn,ox is the density-gradient coefficient in the oxide (SI unit: V·m
2), and 
dn is the penetration depth into the oxide (m), given by
 
    where m*n,ox and 
mn,ox are the effective masses in the oxide (SI unit: kg) and 
Φn,ox is the potential barrier height (SI unit: V). For silicon–silicon dioxide interfaces, Jin et. al. suggested the values of 0.22 
m0, 0.5 
m0, and 3.15 V, where 
m0 is the electron mass.