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Current to enter a current I0 (SI unit: A). The default is zero current, corresponding to an open circuit.
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Circuit (current) to specify a terminal connected to an external circuit, where the external circuit acts as a current source for the semiconductor model.
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Circuit (voltage) to specify a terminal connected to an external circuit, where the external circuit acts as a voltage source for the semiconductor model.
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Power to enter a current P0 (SI unit: W). The default is zero power, corresponding to an open circuit.
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Use the Ideal ohmic option for a nonrectifying metal-semiconductor junction, that is a contact with negligible resistance relative to the total resistance of the modeled semiconductor device.
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Use the Ideal Schottky option for a simple rectifying metal-semiconductor junction, that is, when the current-voltage characteristics at the interface depend on the potential barrier formed at the junction. For this option, surface recombination effects and surface charge densities associated with surface traps can be included in the model by adding Trap-Assisted Surface Recombination boundary conditions to the same boundary selection as the Metal Contact boundary condition.
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Effective Richardson constant for electrons An*(SI unit: A/(m2⋅K2)). The default constant is 110 A/(K⋅cm)2 for silicon.
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Effective Richardson constant for holes Ap* (SI unit: A/(m2⋅K2)). The default constant is 90 A/(K⋅cm)2 for silicon.
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Surface recombination velocity, electrons Vs,n (SI unit: m/s). The default is 21605 m/s for silicon.
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