To set up a far-field calculation for a structure consisting of a superstrate and a substrate, with different but isotropic material properties, add a Far-Field Domain, Inhomogeneous node. Use the Superstrate and the Substrate subnodes to specify the settings needed to define the superstrate and the substrate, respectively. Use the Far-Field Calculation (Far-Field Domain, Inhomogeneous) subnode to specify all other settings needed to define the far-field calculation. The normal to the interface between the substrate and the superstrate should be aligned with one of the Cartesian axes. The interface plane should be a flat surface.

If a Perfectly Matched Layer (PML) node has been added before adding the Far-Field Domain, Inhomogeneous node, all the domains in the Electromagnetic Waves, Frequency Domain interface adjacent to the PML are automatically selected by default. If there is no PML, all of the domains are selected. The selection can be modified. In that case, select domain group that is outside of all radiating and scattering objects and which has the material settings of the far-field media.

To reduce the symmetry, use a Symmetry Plane node. Not more than one Symmetry Plane node should be used to set up the far-field calculation using a Far-Field Domain, Inhomogeneous node.

The schematic available in the Settings for the Far-Field Domain, Inhomogeneous node shows the definition of the elevation and the azimuthal angles used in the calculation of the far field.

The Far-Field Domain, Inhomogeneous node is only available for 3D.