RF simulations are frequently used to extract S-parameters characterizing the transmission and reflection of a device. Figure 1 shows the electric field distribution in a dielectric loaded H-bend waveguide component. A rectangular TE
10 waveguide mode is launched into the inport at the near end of the device and is absorbed by the outport at the far end. The bend region is filled with silica glass.

In Figure 3 and
Figure 4, an application library entry for the RF Module shows how a human head absorbs a radiated wave from an antenna held next to an ear. The temperature is increased by the absorbed radiation.
Both in 2D and 3D, the analysis of periodic structures is popular. Figure 6 is an example of a plane wave incidence on a wire grating with a dielectric substrate.
