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In the Select Physics tree, select Optics > Wave Optics > Electromagnetic Waves, Frequency Domain (ewfd).
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Click Add.
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Click
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In the Select Study tree, select Preset Studies for Selected Physics Interfaces > Wavelength Domain.
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Browse to the model’s Application Libraries folder and double-click the file metasurface_beam_deflector_parameters.txt.
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Locate the Selections of Resulting Entities section. Select the Resulting objects selection checkbox, to generate a domain selection named Substrate.
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Click the
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Locate the Selections of Resulting Entities section. Find the Cumulative selection subsection. Click New.
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Click OK.
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Click OK.
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Click OK.
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Drag and drop below Form Union (fin), to generate a domain where the posts are subtracted from the air block.
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Go to the Add Material window.
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In the tree, select Optical > Inorganic Materials > Si - Silicon, silicides and silicates > Amorphous silicon (α-Si) > Si (Silicon) (Pierce and Spicer 1972: a-Si; n,k 0.0103-2.07 um).
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Click the Add to Component button in the window toolbar.
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In the tree, select Optical > Inorganic Materials > O - Oxygen and oxides > Fused silica > SiO2 (Silicon dioxide, Silica, Quartz) (Malitson 1965: Fused silica; n 0.21-6.7 um).
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Click the Add to Component button in the window toolbar.
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Locate the Material Contents section. In the table, enter the following settings:
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In the Materials toolbar, click
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Click to select the
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Locate the Port Handling section. From the Diffraction order specification list, choose From current parameters, as only normal incidence will be considered in this model.
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Click Add Diffraction Orders, to automatically generate the diffraction orders for both ports.
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