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In the Select Physics tree, select Optics > Wave Optics > Electromagnetic Waves, Frequency Domain (ewfd).
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Click Add.
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Click
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In the Select Study tree, select Preset Studies for Selected Physics Interfaces > Wavelength Domain.
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Click
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Click to expand the Layers section. In the table, enter the following settings:
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Click to expand the Layers section. In the table, enter the following settings:
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Clear the Layers on bottom checkbox.
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Select the Layers to the right checkbox.
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Click
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Select the object r1 only.
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Locate the Selections of Resulting Entities section. Select the Resulting objects selection checkbox.
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Select the object r2 only.
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Locate the Layers section. In the table, enter the following settings:
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Clear the Layers on bottom checkbox.
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Select the Layers to the right checkbox.
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Click
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Go to the Add Material window.
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Right-click and choose Add to Component 1 (comp1).
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In the tree, select Optical > Inorganic Materials > Ag - Silver > Experimental data: thin film > Ag (Silver) (Ciesielski et al. 2017: Ag/SiO2; n,k 0.191-20.9 um).
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Right-click and choose Add to Component 1 (comp1).
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In the Model Builder window, under Component 1 (comp1) > Materials click Ag (Silver) (Ciesielski et al. 2017: Ag/SiO2; n,k 0.191-20.9 um) (mat2).
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Go to the Add Material window.
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In the tree, select Optical > Inorganic Materials > O - Oxygen and oxides > Thin film > SiO2 (Silicon dioxide, Silica, Quartz) (Gao et al. 2013: Thin film; n,k 0.252-1.25 um).
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Right-click and choose Add to Component 1 (comp1).
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In the Model Builder window, under Component 1 (comp1) right-click Definitions and choose Variables.
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Locate the Variables section. In the table, enter the following settings:
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In the Model Builder window, under Component 1 (comp1) click Electromagnetic Waves, Frequency Domain (ewfd).
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From the Electric field components solved for list, choose In-plane vector, as only the in-plane polarization will be included in the simulation.
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From the list, choose User-controlled mesh.
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In the Logical expression for inclusion text field, type z<=0. This enables to visualize the fields inside the metamaterial only.
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In the Settings window for 2D Plot Group, type Instantaneous Electric Field norm (ewfd) in the Label text field.
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In the Model Builder window, expand the Instantaneous Electric Field norm (ewfd) node, then click Surface 1.
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In the Model Builder window, right-click Instantaneous Electric Field norm (ewfd) and choose Duplicate.
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In the Settings window for 2D Plot Group, type Electric Field Components (ewfd) in the Label text field.
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In the Model Builder window, expand the Electric Field Components (ewfd) node, then click Surface 1.
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In the Model Builder window, under Component 1 (comp1) right-click Definitions and choose Variables.
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In the Settings window for Variables, type Relative Permittivity, Effective Medium Theory in the Label text field.
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Locate the Variables section. In the table, enter the following settings:
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Locate the Variables section. In the table, enter the following settings:
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Locate the Geometric Entity Selection section. From the Selection list, choose Array 2 - Dielectric Layers.
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Locate the Variables section. In the table, enter the following settings:
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In the Settings window for Adjacent, type Metal-dielectric Interior Boundaries in the Label text field.
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Click OK.
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In the Settings window for Variables, type Calculated Effective Relative Permittivity in the Label text field.
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Locate the Variables section. In the table, enter the following settings:
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Go to the Add Study window.
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Find the Studies subsection. In the Select Study tree, select Preset Studies for Selected Physics Interfaces > Wavelength Domain.
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Right-click and choose Add Study.
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Clear the Generate default plots checkbox.
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In the Settings window for 1D Plot Group, type Effective Relative Permittivity in the Label text field.
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Click to expand the Coloring and Style section. Find the Line style subsection. From the Line list, choose None.
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Locate the Legends section. In the table, enter the following settings:
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Locate the Plot Settings section.
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