References for the Piezoresistivity Interfaces
1.
R.F. Tinder,
Tensor Properties of Solids
, Morgan and Claypool Publishers, 2008.
2.
R.E. Newnham,
Properties of Materials
, Oxford University Press, 2005.
3.
M. Bao,
Analysis and Design Principles of MEMS Devices
, Elsevier B. V., 2005.
4.
S.D. Senturia,
Microsystem Design
, Springer, 2000.
5.
A. A. Barlian; W.-T. Park; J.R. Mallon, Jr.; A.J. Rastegar; and B.L. Pruitt, “Review: Semiconductor Piezoresistance for Microsystems,”
Proceedings of the IEEE
, vol. 97, no. 3, 2009.
6.
C.S. Smith, “Piezoresistance Effect in Germanium and Silicon,”
Phys. Rev.
, vol 94, no. 1, pp. 42–49, 1957.
7.
C. Jacoboni, C. Canali, G. Ottaviani, and A. Alberigi Quaranta, “A Review of Some Charge Transport Properties of Silicon,”
Solid-State Electronics
, vol. 20, pp. 77–89, 1977.