New Models in Version 6.4
Memristor
This model captures the dynamic resistive switching behavior of an oxide-based memristor. The device features a thin metal oxide layer sandwiched between two metal electrodes. When a voltage is applied, oxygen vacancies within the oxide layer migrate, acting as charge carriers and enabling resistive switching.
The model incorporates key physical phenomena, including oxygen vacancy drift–diffusion, current continuity, and heat transfer, all fully coupled through a multiphysics framework. These interactions are essential to accurately reproduce the device's behavior. Simulation results reveal the characteristic pinched hysteresis curve of memristors, closely aligning with experimental data reported in the literature.
Metal–Insulator–Metal (MIM) Diode
This example shows how to model a simple Metal–Insulator–Metal (MIM) diode. The two metal electrodes are defined on each side using a Metal Contact feature. Two studies are performed: one without quantum tunneling across the potential barrier and another using the WKB Tunneling Model feature to include it. The resulting I–V characteristics are then compared between two studies: with and without tunneling.
Shockley Diode
This example shows how to model a simple Shockley diode — a four-layer PNPN semiconductor device. An Analytic Doping Model node is used to define the doping profiles for each domain. A time-dependent study is employed to calculate the I–V characteristics of the diode.
Tunnel Diode
This tutorial demonstrates how to model the band-to-band tunneling across a p–n junction. The tunneling effect is imitated by defining the User-Defined Recombination domain feature, which makes the electrons disappear from the conduction band on the n-side and makes the holes disappear from the valence band on the p-side. The resulting J–V curve under forward bias is derived from the model.