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In the Application Libraries window, select Semiconductor Module>Transistors>trench_gate_igbt_2d in the tree.
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Click Open.
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Browse to the model’s Application Libraries folder and double-click the file trench_gate_igbt_2d.mph.
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In the Model Builder window, under Component 2 (comp2)>Geometry 2>Work Plane 1 (wp1)>Plane Geometry click Point 1 - Emitter contact & doping boundary (pt1).
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On the object fin, select Boundaries 12, 15, 28, 31, 40, 42, 43, 45, 47, 49, 51, 52, 54, 56, 67, 69, 73, 77, 80, and 82 only.
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In the Model Builder window, expand the Semiconductor (semi2) node, then click Semiconductor Material Model 1.
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In the Model Builder window, expand the Semiconductor Material Model 1 node, then click Caughey-Thomas Mobility Model (E) 1.
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In the Model Builder window, under Component 2 (comp2)>Semiconductor (semi2) click Analytic Doping Model - n-base.
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In the Model Builder window, expand the Geometric Doping Model - p-base node, then click Boundary Selection for Doping Profile 1.
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In the Model Builder window, under Component 2 (comp2)>Semiconductor (semi2) click Geometric Doping Model - p+ emitter.
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In the Model Builder window, expand the Geometric Doping Model - p+ emitter node, then click Boundary Selection for Doping Profile 1.
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In the Model Builder window, under Component 2 (comp2)>Semiconductor (semi2) click Geometric Doping Model - n+ emitter.
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In the Model Builder window, expand the Geometric Doping Model - n+ emitter node, then click Boundary Selection for Doping Profile 1.
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In the Model Builder window, under Component 2 (comp2)>Semiconductor (semi2) click Trap-Assisted Recombination 1.
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Click to expand the Control Entities section. Clear the Smooth across removed control entities check box.
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Click the Custom button.
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Click to expand the Control Entities section. Clear the Smooth across removed control entities check box.
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Click to expand the Control Entities section. Clear the Smooth across removed control entities check box.
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In the Settings window for Distribution, type Distribution 3 - Left surface in the Label text field.
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In the Settings window for Distribution, type Distribution 4 - Right surface in the Label text field.
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In the Settings window for Distribution, type Distribution 5 - Bottom surface in the Label text field.
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In the Settings window for Distribution, type Distribution 3 - p+ collector in the Label text field.
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Click to expand the Control Entities section. Clear the Smooth across removed control entities check box.
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In the Model Builder window, under Component 2 (comp2)>Mesh 2 right-click Swept 1 and choose Duplicate.
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In the Model Builder window, expand the Study 1 - 2D node, then click Step 1: Semiconductor Equilibrium.
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In the Settings window for Semiconductor Equilibrium, locate the Physics and Variables Selection section.
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In the Model Builder window, under Study 1 - 2D, Ctrl-click to select Step 1: Semiconductor Equilibrium and Step 2: Stationary.
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Right-click and choose Copy.
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In the Model Builder window, under Study 2 - 3D, Ctrl-click to select Step 1: Semiconductor Equilibrium and Step 2: Stationary.
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In the Settings window for Semiconductor Equilibrium, locate the Physics and Variables Selection section.
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In the Model Builder window, expand the Study 2 - 3D>Solver Configurations>Solution 3 (sol3) node, then click Dependent Variables 2.
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In the Model Builder window, expand the Study 2 - 3D>Solver Configurations>Solution 3 (sol3)>Dependent Variables 2 node, then click Voltage drop across contact (comp2.semi2.V_dae).
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Click to expand the Coloring and Style section. Find the Line style subsection. From the Line list, choose Dashed.
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In the Model Builder window, under Results>J-V (log) - Fig.4(a), Ctrl-click to select Global 1 - 3D and Global 1 - 2D scaled.
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Right-click and choose Copy.
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In the Model Builder window, under Component 2 (comp2)>Semiconductor (semi2) click Thin Insulator Gate 1.
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In the Settings window for 3D Plot Group, type Electron Concentration & Current Streamlines 3D in the Label text field.
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In the Settings window for Streamline, type Streamline 1 - Electron current in the Label text field.
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Click Replace Expression in the upper-right corner of the Expression section. From the menu, choose Component 2 (comp2)>Semiconductor>Currents and charge>Electron current>semi2.JnX,...,semi2.JnZ - Electron current density.
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Locate the Coloring and Style section. Find the Point style subsection. From the Color list, choose Black.
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Click Replace Expression in the upper-right corner of the Expression section. From the menu, choose Component 2 (comp2)>Semiconductor>Currents and charge>Hole current>semi2.JpX,...,semi2.JpZ - Hole current density.
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Locate the Coloring and Style section. Find the Point style subsection. From the Color list, choose White.
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