References for the Piezoresistivity Interfaces
1. R.F. Tinder, Tensor Properties of Solids, Morgan and Claypool Publishers, 2008.
2. R.E. Newnham, Properties of Materials, Oxford University Press, 2005.
3. M. Bao, Analysis and Design Principles of MEMS Devices, Elsevier B. V., 2005.
4. S.D. Senturia, Microsystem Design, Springer, 2000.
5. A. A. Barlian; W.-T. Park; J.R. Mallon, Jr.; A.J. Rastegar; and B.L. Pruitt, “Review: Semiconductor Piezoresistance for Microsystems”, Proceedings of the IEEE, vol. 97, no. 3, 2009.
6. C.S. Smith, “Piezoresistance Effect in Germanium and Silicon”, Physical Review, vol. 94, no. 1, pp. 42–49, 1957.
7. C. Jacoboni, C. Canali, G. Ottaviani, and A. Alberigi Quaranta, “A Review of Some Charge Transport Properties of Silicon”, Solid-State Electronics, vol. 20, pp. 77–89, 1977.