References for the Charged Particle Tracing Interface
1. NIST Stopping-Power and Range Tables for Electrons, Protons, and Helium Ions, http://www.nist.gov/pml/data/star/index.cfm.
2. International Geomagnetic Reference Field (IGRF), http://www.ngdc.noaa.gov/IAGA/vmod/igrf.html.
3. Z. Ristivojevic and Z.L. Petrovic. “A Monte Carlo simulation of ion transport at finite temperatures.” Plasma Sources Science and Technology, vol. 21, no. 3, 035001, 12 pp, 2012.
4. H.R. Skullerud, “The stochastic computer simulation of ion motion in a gas subjected to a constant electric field.” Journal of Physics D: Applied Physics, vol. 1, no. 11, pp. 1567-1568, 1968.
5. K. Nanbu, “Probability theory of electron-molecule, ion-molecule, molecule-molecule, and Coulomb collisions for particle modeling of materials processing plasmas and cases.” IEEE Transactions on plasma science , vol. 28, no. 3, pp. 971-990, 2000.
6. L.D. Landau and E.M. Lifshitz, Mechanics, 3rd ed., Elsevier, 1976.
7. J.F. Ziegler, J.P. Biersack, and M. D. Ziegler, The Stopping and Range of Ions and Matter, SRIM, 2015.
8. A.B. Chilton, J.K. Shultis, and R.E. Faw, Principles of Radiation Shielding, Prentice-Hall, 1984.
9. J.E. Martin, Physics for Radiation Protection, Wiley, 2013.
10. S. Humphries, Charged Particle Beams, Dover, 2013.
11. S.M. Lund, T. Kikuchi, R. C. Davidson, “Generation of initial Vlasov distributions for simulation of charged particle beams with high space-charge intensity”, Physical Review Special Topics — Accelerators and Beams, 2007.
12. P.T. Kirstein, G. S. Kino, and W. E. Waters, Space charge flow, McGraw-Hill, 1967.
13. Y. Yin and H.H. Sawin, “Surface Roughening of Silicon, Thermal Silicon Dioxide, and Low-k Dielectric Coral Films in Argon Plasma”, J. Vac. Sci. Technol. A, vol. 26, no. 1, pp. 151–160, 2008.
14. W. Guo and H.H. Sawin, “Modeling of the Angular Dependence of Plasma Etching”, J. Vac. Sci. Technol. A, vol. 27, no. 6, pp. 1326–1336, 2009.