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Disc Resonator Anchor Losses
Introduction
Electromechanical resonators and filters are widely used in signal processing and communications applications. Over the past decade significant progress has been made in miniaturizing these systems using microfabrication technologies. In many of these applications it is important to produce resonators with high quality factors. Several mechanisms limit the obtainable quality factors of MEMS resonators including thermoelastic damping (for flexural modes), material losses (the fundamental limiting factor on the obtainable quality factor), and anchor losses. Anchor losses occur when the vibration of the structure and its supporting anchors excites acoustic waves propagating in the substrate. These waves are radiated away from the resonator resulting in a loss of mechanical energy, or damping. In many cases anchor damping can represent the limiting loss mechanism that determines the resonator quality factor. Modifications in the anchor design can significantly effect the coupling of the resonant mode to the substrate, so numerical simulations of anchor damping can be a useful tool to employ as part of the resonator design process.
This model shows how to determine the anchor damping limited resonator quality factor of a diamond disc resonator, using a PML to absorb the waves propagating in the substrate. It is based on the work presented in Ref. 1 and Ref. 2.
Model Definition
Figure 1 shows a slice through the structure on a plane with an edge parallel to the line of axial symmetry. The critical components of the device are highlighted. The resonator is attached to the substrate by a polysilicon stem. The disc (polycrystalline diamond) and stem (polysilicon) are made from different materials so that there is an impedance mismatch between the materials. This mismatch is designed to suppress energy transfer to the substrate, enhancing the quality factor of the device Ref. 1. A hemispherical section of the substrate is modeled and the waves propagating away from the anchor are absorbed by a perfectly matched layer (PML), which is applied to a layer at the edge of the substrate. The outer surface of the PML is fixed.
Since the fundamental model has axial symmetry, the device is modeled using a 2D axisymmetric geometry.
Figure 1: Axisymmetric model geometry, with key parts of the structure highlighted.
Results and Discussion
Figure 2 shows the resonator displacement in the fundamental mode of the resonator, which occurs at a frequency of 537 MHz. This compares reasonably well with the experimentally measured value of the resonant frequency, which was 546 MHz. Figure 3 shows a 3 dimensional rendering of the displacement, with a color scale chosen to emphasize the waves propagating in the substrate. The energy transmitted by these waves is responsible for the anchor losses. The effect of the PML is also apparent in this figure, and it seems that the waves are absorbed well by the PML in this model.
The quality factor of the resonator is related to the ratio of the real and imaginary parts of the eigenvalue of the mode. In this case the computed quality factor is 22,000, which is a similar magnitude to the quality factor measured in vacuum of approximately 17,500 (Ref. 1). This indicates that anchor damping is likely to be the dominant loss mechanism for devices designed in this manner.
Figure 2: Section through the axisymmetric vibration mode of the disc showing the displacement of the structure. The disc undergoes uniform extension along the radial direction.
Figure 3: Total displacement of the structure as a whole with a color scale chosen to emphasize the waves propagating in the substrate.
References
1. J. Wang, J.E. Butler, T. Feygelson, and C. T.-C. Nguyen, “1.51-GHz nanochrystalline diamond micromechanical disk resonator with material-mismatched isolating support,” Proceedings of the 17th International IEEE Microelectromechanical Systems Conference, pp. 641–644, Maastricht, 2004.
2. P. Steeneken “Parameter Extraction and Support-Loss in MEMS Resonators”, COMSOL Conference 2007, Grenoble. (Available at: https://www.comsol.com/paper/download/43866/Steeneken_pres.pdf and https://arxiv.org/ftp/arxiv/papers/1304/1304.7953.pdf.)
Application Library path: MEMS_Module/Actuators/disc_resonator_anchor_losses
Modeling Instructions
From the File menu, choose New.
New
In the New window, click  Model Wizard.
Model Wizard
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In the Model Wizard window, click  2D Axisymmetric.
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In the Select Physics tree, select Structural Mechanics>Solid Mechanics (solid).
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Click Add.
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Click  Study.
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In the Select Study tree, select General Studies>Eigenfrequency.
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Global Definitions
Parameters 1
1
In the Model Builder window, under Global Definitions click Parameters 1.
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In the Settings window for Parameters, locate the Parameters section.
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Geometry 1
Rectangle 1 (r1)
1
In the Model Builder window, expand the Component 1 (comp1)>Geometry 1 node.
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Right-click Geometry 1 and choose Rectangle.
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In the Settings window for Rectangle, locate the Size and Shape section.
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In the Width text field, type R_d.
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In the Height text field, type H_d.
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Locate the Position section. In the z text field, type H_p.
Rectangle 2 (r2)
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In the Geometry toolbar, click  Rectangle.
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In the Settings window for Rectangle, locate the Size and Shape section.
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In the Width text field, type R_p.
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In the Height text field, type 2*H_d+2*H_p.
Rectangle 3 (r3)
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In the Geometry toolbar, click  Rectangle.
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In the Settings window for Rectangle, locate the Size and Shape section.
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In the Width text field, type 2.5*R_p.
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In the Height text field, type H_d.
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Locate the Position section. In the z text field, type H_d+2*H_p.
Circle 1 (c1)
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In the Geometry toolbar, click  Circle.
2
In the Settings window for Circle, locate the Size and Shape section.
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In the Radius text field, type R_s+t_PML.
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In the Sector angle text field, type 90.
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Locate the Rotation Angle section. In the Rotation text field, type 270.
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Click to expand the Layers section. In the table, enter the following settings:
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Click  Build Selected.
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Click the  Zoom Extents button in the Graphics toolbar.
Definitions
Perfectly Matched Layer 1 (pml1)
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In the Definitions toolbar, click  Perfectly Matched Layer.
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Materials
Silicon Substrate
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In the Model Builder window, under Component 1 (comp1) right-click Materials and choose Blank Material.
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In the Settings window for Material, type Silicon Substrate in the Label text field.
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Locate the Material Contents section. In the table, enter the following settings:
Polysilicon
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Right-click Materials and choose Blank Material.
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In the Settings window for Material, type Polysilicon in the Label text field.
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Locate the Material Contents section. In the table, enter the following settings:
Diamond
1
Right-click Materials and choose Blank Material.
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In the Settings window for Material, type Diamond in the Label text field.
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4
Locate the Material Contents section. In the table, enter the following settings:
Solid Mechanics (solid)
Fixed Constraint 1
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In the Model Builder window, under Component 1 (comp1) right-click Solid Mechanics (solid) and choose Fixed Constraint.
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Mesh 1
Mapped 1
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In the Mesh toolbar, click  Mapped.
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In the Settings window for Mapped, locate the Domain Selection section.
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From the Geometric entity level list, choose Domain.
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Distribution 1
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Right-click Mapped 1 and choose Distribution.
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In the Settings window for Distribution, locate the Distribution section.
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In the Number of elements text field, type 8.
Distribution 2
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In the Model Builder window, right-click Mapped 1 and choose Distribution.
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In the Settings window for Distribution, locate the Distribution section.
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In the Number of elements text field, type 4.
Free Triangular 1
In the Mesh toolbar, click  Free Triangular.
Size
1
In the Model Builder window, click Size.
2
In the Settings window for Size, locate the Element Size section.
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From the Predefined list, choose Extremely fine.
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Click  Build All.
Study 1
Step 1: Eigenfrequency
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In the Model Builder window, under Study 1 click Step 1: Eigenfrequency.
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In the Settings window for Eigenfrequency, locate the Study Settings section.
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Select the Desired number of eigenfrequencies check box.
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In the Search for eigenfrequencies around text field, type 5e8.
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In the Home toolbar, click  Compute.
Results
Mode Shape (solid)
In the Model Builder window, expand the Mode Shape (solid) node.
Deformation
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In the Model Builder window, expand the Results>Mode Shape (solid)>Surface 1 node, then click Deformation.
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In the Settings window for Deformation, locate the Scale section.
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Select the Scale factor check box.
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In the Mode Shape (solid) toolbar, click  Plot.
Compare the resulting plot with that in Figure 2.
Mode Shape, 3D (solid)
In the Model Builder window, expand the Results>Mode Shape, 3D (solid) node.
Deformation
1
In the Model Builder window, expand the Results>Mode Shape, 3D (solid)>Surface 1 node.
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Right-click Deformation and choose Disable.
Surface 1
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In the Model Builder window, click Surface 1.
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In the Settings window for Surface, locate the Expression section.
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From the Unit list, choose µm.
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Click to expand the Range section. Select the Manual color range check box.
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In the Maximum text field, type 6e-7.
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In the Mode Shape, 3D (solid) toolbar, click  Plot.
Compare the resulting plot with that in Figure 3.
Global Evaluation 1
1
In the Results toolbar, click  Global Evaluation.
2
In the Settings window for Global Evaluation, locate the Expressions section.
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Click  Evaluate.